目录简介 | Contents
Foreword
1 Scope
2 Normative References
3 Terms and Definitions
4 Product classifications
5 Requirements
5.1 Service condition
5.2 Service performance
5.3 Reliability
5.4 Security
5.5 Stability
5.6 Appearance quality
6 Testing methods
6.1 Testing condition
6.2 Main instruments and appliances for test
6.3 The penetrating power and transillumination sensitivity test of the high-frequency defectoscope
6.4. Uniformity test for the radiation angle and radiation field of the high-frequency defectoscope
6.5 Determination method for timing error of the timer
6.6 Adjustment test for the tube voltage
6.7 Overvoltage protection test of the high-frequency defectoscope
6.8. Over current protection test of the high-frequency defectoscope
6.9 Test for temperature protective device of high-frequency defectoscope
6.10 Test for low-pressure protective device of the high-frequency defectoscope
6.11 Stability test for continuous operation of high-frequency defectoscope
6.12 Test for air kerma rate of leakage ray of high-frequency defectoscope
6.13 Low-voltage loop insulating resistance, insulating strength and ground test
6.14. Test voltage for insulating strength of the high-Voltage loop
6.15 Leak test for tube head, high-voltage generator, cooling, unit and other sealing elements of the high-frequency defectoscope
6.16 Test environment temperature
6.17. Test for transportation and storage environment
6.18 Packaging test
6.19 Normal work test when the power supply voltage fluctuates
6.20 Determination for stability of tube voltage and tube current
6.21 Appearance quality inspection
7 Inspection rules
7.1 EX factory inspection
7.2 Type test
7.3 Sampling and regulation determination
8 Mark, packing, transportation and storage
8.1 Mark
8.2 Package
8.3. Transportation and storage
Annex A (Normative) Standard test block for high frequency and constant potential X-ray detection machine
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